futureC integration software for on-wafer test

· futureC is a unified hardware communication
· and testing platform independently developed by Eoulu
· and it is also an operating system for on-wafer test and measurement
· futureC can easily integrate all the programmable devices.

Category:

Probe Station Software

Contact Information

info@eoulu.com

65-84765918

CONTACT NOW

Product Features
Product Mix
Product Parameters
Instructions

Upgraded version for EUCP futureC can help you for all this

Integrating all kinds of programmable testing equipment fast, and Mapping fast

Platform is separated from application and instrument, modular maintenance by professional software team, reduce the dependence of the measurement on engineers

High-precision and high-speed test

What you measure is what you get, the original data and extraction parameters are automatically consolidated into a file, and it can be seamlessly uploaded to the futureD database.
Rapid system integration

Device communication

Separation of device driver from test platforms,rich device driver library and modular driver development

Quickly start test

Set the test menu

Automatically list the integrated devices and application input and output parameters User-defined test process as measurement recipe Import/Export measurement recipe

Test result binning

User-defined binning conditions Set the conditions for acceptance/rejection of test results Supports up to 4,096 bins and color gradient map

What you measure is what you get

File data formatting and saving User-defined test result output items and sequence Dragging function makes operation convenient and fast

Multiple measurement modes

Single-point test and measurement Single-position repeated test and measurement on-wafer measurement and multi-chip measurement supported Graphical curve display of 2D curve,3D curve, RF curve display and oscilloscope waveform Display test information and brief data statistics,such as test time and yield

Mapping and measurement control

MapEditor

Users have a more intuitive experience based on the traditional wafer map editor User-defined SubDie map Accurately map the actual position of the DUT

Wafer test system

Support automatic and semiautomatic wafer test Support customizable location testSupport rich test result color scale diagrams

Offline classification of data

Users can redefine binning conditions according to test data and wafer map Once binning condition is redefined, the data covers the original wafer map

Multiple test modes

Support selective retest Support continuous test of breakpoints Customize location for test Test alarm and alarm device reminder

Factory automation

SECS/GEM protocol components

Seamless connection to futureD(web big data management platform)SEMI E5-0600 (SECS-II) standard SEMI E30 (GEM) standard SEMI E37 (HSMS) standard

futureC installation environment

No special environmental requirements.

Note: futureC supports real-time data storage and continuous test of breakpoints to avoid unexpected loss of data.

Typical speed values of futureC test system

The test speed is related to the configuration and running status of the test PC. The operation resources for the following typical values are Win10 64bit, CPU I7-9, and 16G memory:

Read and write of files	0.003s / 1000 lines
Instrument IO	85ms / time
2Port-S parameter (201 points, IFBW=10KHz)	200ms / DUT
DC scan (K2400, AutoRange)	3.9s / 50 point

Operating environment

Recommended configuration for PC side:
Operating system	Win10/Win11
Processor	Intel Core i3 Quad-core 3.6GHz
Graphics card	Discrete graphics card 1G
Internal storage	8 GB running memory
Hard disk	500GHz
Browser	Not involved
Resolution of display	1920×1080

Appendix 1: Examples of Common Drivers

Equipment manufacturer	Programmable device category	Equipment model
Keysight (former Agilent)	DC Power Supply	Agilent E3631 Series
		Agilent 6625A, 6626A,6628A, and 6629A
		Agilent N6700 Series
	DC Source Meter	HP 4142B
	Dynamic Signal Analyzer	Agilent 35670
	ENA	Agilent E5071 Series
		Agilent E8362 Series
		Agilent E8363 Series
	LCR Meter	Agilent LCR E49XX Series
	LCR Meter	Agilent LCR 4284A
	Lightwave Component Analyzer	Agilent N4373
	Multimeter	Agilent 34410
		Agilent 34411
		Agilent 3458A
		Agilent 34401
	Oscilloscope	Agilent 86100 Series
		Agilent 54830 Infiniium Series
		Agilent InfiniiVision 6000 Series
	PNA-X	Agilent PNA-X Series
	Semiconductor Parameter Analyzer	Agilent 4156 Series
		Agilent B1500 Series
		Agilent B1505 Series
	DAQ/Switch	Agilent 34972A
		Agilent B2201A
		Agilent 5250A
		HP 4085M
	Pulse/Data Generator	Agilent 81110A
	Pulse/Data Generator	Agilent 81104A
	Function / Arbitrary Waveform Generator	Agilent 33500 & 33600 Series Waveform Generators
	NFA Series	Agilent N897xA
	Agilent X-Series Signal Analyzer	PXA Signal Analyzer N9030A
		MXA Signal Analyzer N9020A
		EXA Signal Analyzer N9010A
		CXA Signal Analyzer N9000A
NI	Function / Arbitrary Waveform Generator	NI 5402
	DAQ/Switch	NI 6501
	DAQ/Switch	NI 6221
TEK	Semiconductor Parameter Analyzer	Keithley 4200A-SCS
	DC Source Meter	Keithley 2400 Series
		Keithley 2500 Series
		Keithley 2600 Series
	DAQ/Switch	Keithley 2700 Series
		Keithley 7001
		Keithley 700 Series
	Electrometer	Keithley 6517 Series
	Function / Arbitrary Waveform Generator	TEK AFG 1000
		TEK AFG 2000
		TEK AFG 3000
		TEK AWG 4000
	Oscilloscope	TEK MDO 3000 Series
	Oscilloscope	TEK MDO 4000 Series
R&S	VNA	ZVA Series
R&S	Signal and Spectrum Analyzer	RSFSW Series
Anritsu	VNA	MS462XX Series
Anritsu	VNA	AU37XX Series
SRS	Lock-In Amplifier	SR830,SR810
YOKOGAWA	Optical Spectrum Analyzer	AQ6370C/AQ6370D/AQ6373/
YOKOGAWA	Optical Spectrum Analyzer	AQ6373B/AQ6375/AQ6375B
Instrument Systems	Spectrometer	CAS 120
Instrument Systems	Spectrometer	CAS 140CT
Maury	Tuner	Maury Automated Tuner Series
Cascade	Prober Station	Cascade Manual Probe Station Full Series
		Cascade Semi-auto Probe Station Full Series
		Cascade Full-auto Probe Station Full Series
		Cascade High Power Probe Station Full Series
Newport	Monochromator	Oriel Cornerstone 260
Newport	Positioning Stages	Nano PZ M562
Auriga	Pulse IV System	Auriga 4850
EOULU	Plug-in	Matlab Controller
EOULU	Plug-in	Third Party COM Object or System
Iwatsu	High Power Static Tester	CT3200
Iwatsu	High Power Static Tester	CT10400
STESLA	High Power Static Tester	Full Series
ASTEK	DC Power Supply	IT6100 Series
		IT6874
		IT8500

Appendix 2: Quick Selection of Test Application Drivers

Application selection	Recommended instrument combination	Measurement item library
DC/CV	Keysight B1500A -B1511B HRSMU measurement range 200 V / 1 A /, resolution 1fA -B1511A MPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1510A HPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1514A MCSMU pulse range 30 V / 1 A (0.1 A DC) 50 µs minimum pulse width, 2 µs resolution -B1520A MFCMU frequency range 1 kHz~5 MHz, resolution 1 mHz -SCUU -GNDU Keysight B2201A -B2211A ×4 12ch low leakage switch module	Vth/Gm/Vknee/Vclamp/Rds/Idsat/Idlin... ID-VD ID-VG CurveFit BV(BVCEO/BVCBO/BVGSS/BVDSS) β CV Sweep Cp-D… Pulse IV
RF	Keysight B1500A -B1511B HRSMU measurement range 200 V / 1 A /, resolution 1fA -B1511A MPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1510A HPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1514A MCSMU pulse range 30 V / 1 A (0.1 A DC) 50 µs minimum pulse width, 2 µs resolution -B1520A MFCMU frequency range 1 kHz~5 MHz, resolution 1 mHz -SCUU -GNDU Keysight N5227B PNA -Bias Module/Bias Tee Wincal Kohzu Positioner - CURX	S1P S2P S3P S4P S2P test under bias voltage TraceFetch P1dB P3dB Power scanning Third-order intermodulation IP3 Noise Figure Automatic calibration Phase scanning
Si-Photoelectric	Keysight LCA N4375E Keysight B2902A supply meter Keysight N7747A optical power meter Keysight N7786B polarizer Keysight 8164B tunable optical generator - 81608A Glsun SUN-FSW-1X8 optical switch PI E-712/ PI Hex-Nano	Autocoupling Beat frequency test Power scanning Wavelength scanning Optoelectronic S parameter test OE - optical responsiveness test OE - Scan the wavelength to test photocurrent OE - scan the optical power to test photocurrent IL PDL FiberArray
Eye Diagram	Keysight 11713A attenuator Keysight 34401A digital Multi-meter Keysight E3631A power supply Keysight 86100A eye diagram analyzer, with the bandwidth exceeding 50 GHz, time-domain reflectometer / time-domain transmission (TDR/TDT) Anritsu MP1800A BERT -MP1800A-001 GPIB -MU181000B 12.5 GHz 4port Synthesizer -MU183040B 28G/32G bit/s High Sensitivity ED -MU195040A 21G/32G bit/s SI ED	Thd (total harmonic distortion) EyeAmplitude EyeCrossing EyeSNR EyeJitterPP EyeJitterRMS EyeFallTime EyeRiseTime
Solder Ball	Keysight B1500A -B1511B HRSMU measurement range 200 V / 1 A /, resolution 1fA -B1511A MPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1510A HPSMU measurement range 100 V / 0.1 A/, resolution 10 fA -B1514A MCSMU pulse range 30 V / 1 A (0.1 A DC) 50 µs minimum pulse width, 2 µs resolution -GNDU Keysight3458A	Ileakage Rs/Rc
MEMS	Keithley 2400 Keysight 5250A Low leakage switch matrix -E5252A ×4 pcs ，12channel Output Matrix Switch Keysight LCRE4980 Keysight 34410A Keysight 35670 Keysight E3631A NI PCI-6221	Qvalue Risolation Rdson CV Bandwith
Reliability Test	Keysight B1500A - B1511B HRSMU measuring range 200 V / 1 A /, resolution 1fA - B1511A MPSMU measuring range 100 V / 0.1 A/, resolution 10 fA - B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA - B1514A MCSMU pulse range 30 V / 1 A（0.1 A DC）minimum pulse width 50 μs, resolution 2 μs - B1530A WGFMU×2 DC output and arbitrary waveform generated, programming resolution 10 ns, high speed voltage/current measurement (200 MSa/s, sampling frequency 5ns) - GNDU Keysight B2201A -B2211A ×4 12ch low leakage switch module	TDDB HCI NBTI Fast-NBTI EM Ramp LifeTime
High Power Test	Keysight B1505A -B1510A HPSMU measuring range 100 V / 0.1 A/, resolution 10 fA -B1512A HCSMU 20A/20 V (pulse);1 A/40 V (DC) -B1513C HVSMU 1500 V/8 mA; 3000 V/4 mA (pulse and DC) -B1520A MFCMU frequency range 1 kHz~5 MHz, resolution1 mHz -GNDU -N1265A	PowerVoltageOn PowerCurrentOn Measure I Measure V Vth/Idmax/Rdson BV(BVCEO/BVCBO/BVGSS/BVDSS) IdVg IdVd CV Sweep Pulse Seep