The best probe station, made in China!
PRODUCTS
Single signal 50 GHz RF Probe
· Extremely low contact resistance and superior impedance control
· It can maintain signal integrity and stability during wide temperature range testing, and the data repeatability is extremely high
· Sky Series radio frequency probes are delivered quickly and repaired in China, with no need to wait
Category:
RF Probe
Contact Information
CONTACT NOW- Product Features
- Product Mix
- Product Parameters
- Instructions
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Special tip design technology and ultra-long service life,suitable for mass production testing
Pad unevenness compatibility up to 25 μm,suitable for testing uneven interfaces
Very low contact resistance and insertion loss
Meet the wide temperature range test of -60℃~200℃
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Key Specifications Single-Signal Dual-Signal (Differential) LF Series RF Series HF Series LF Series RF Series HF Series Maximum Frequency 50 GHz 110 GHz 110 GHz 67 GHz 110 GHz 110 GHz Typical Insertion Loss @ 40 GHz **GSG,150 μm Pitch,Standard GSGSG,150 μm Pitch,Standard
- 0.50 dB - 0.62 dB - 0.57 dB - 0.80 dB - 0.80 dB - 0.80 dB Typical Return Loss @ 40 GHz ** GSG,150 μm Pitch,Standard GSGSG,150 μm Pitch,Standard
- 20.50 dB - 17.80 dB - 18.54 dB - 13.00 dB - 13.00 dB - 13.00 dB Typical Contact Resistance *** ＜10 mΩ ＜10 mΩ ＜10 mΩ ＜10 mΩ ＜10 mΩ ＜10 mΩ Tip Configuration GSG, GS,SG GSG, GS,SG GSG, GS,SG GSGSG, GSSG GSGSG, GSSG GSGSG, GSSG Probe Pitch ***** 50 μm ~ 1250 μm（25 μm step）
50 μm ~ 1250 μm（25 μm step）
50 μm ~ 1250 μm（25 μm step）
50 μm ~ 1250 μm（25 μm step）
50 μm ~ 1250 μm（25 μm step）
50 μm ~ 1250 μm（25 μm step）
Typical Lifetime ****** ＞1,000,000 ＞1,000,000 ＞1,000,000 ＞1,000,000 ＞1,000,000 ＞1,000,000 Maximum Temperature 200°C 200°C 200°C 200°C 200°C 200°C Minimum Pad Size 70 × 70 μm 30 × 30 μm 30 × 30 μm 70 × 70 μm 30 × 30 μm 30 × 30 μm Features · Suitable for uneven wafer
· Stable testing
· High repeatability
· Long lifetime
· Fast delivery
· Ultra Low Contact Resistance
· Small contact marks
· Stable testing
· High repeatability
· Ultra low Contact Resistance
· Small contact marks
· Stable testing
· High repeatability
· Suitable for uneven wafer
· Stable testing
· High repeatability
· Long lifetime
· Fast delivery
· Ultra low Contact Resistance
· Small contact marks
· Stable testing
· High repeatability
· Ultra low Contact Resistance
· Small contact marks
· Stable testing
· High repeatability
Recommendation ******* · PCB Board Testing
· Mass Production Testing
· Filter Testing · Device Modeling Testing
· Characterization Testing
· PCB Board Testing
· Mass Production
· Filter Testing · Device Modeling Testing
· Characterization Testing
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